抗辐射32位处理器标准评估电路的性能评估

Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium Pub Date : 1991-06-12 DOI:10.1109/UGIM.1991.148133

N.A. Koziarz

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引用次数: 0

摘要

提出了在实际生产前确定承包商满足抗辐射32b处理器要求的能力的方法。对标准评估电路进行了检查，结果用于评估承包商的绩效。通过晶圆良率、电气测试、封装筛选和辐射测试等测试，测试芯片可用于判断最终产品。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Assessing performance of standard evaluation circuits for radiation hardened 32 bit processor

Methods of determining contractors' ability to meet the requirements of the radiation-hardened 32-b processor before actual production are presented. Standard evaluation circuits were examined, and the results used a gauge to evaluate the contractor performance. Using tests such as wafer yield, electrical tests, package screening, and radiation testing, the test chip could be used to judge the final product.<>

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Proceedings Ninth Biennial University/Government/Industry Microelectronics Symposium

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