{"title":"利用原子力显微镜研究光电器件性能的方法","authors":"K. Gajewski, G. Wielgoszewski","doi":"10.1109/STYSW.2010.5714160","DOIUrl":null,"url":null,"abstract":"In the modern world, the influence the optoelectronic devices on the communications methods are still increasing. Therefore it is very important to find appropriate techniques for design, building, testing, measuring and packaging.","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy\",\"authors\":\"K. Gajewski, G. Wielgoszewski\",\"doi\":\"10.1109/STYSW.2010.5714160\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the modern world, the influence the optoelectronic devices on the communications methods are still increasing. Therefore it is very important to find appropriate techniques for design, building, testing, measuring and packaging.\",\"PeriodicalId\":160376,\"journal\":{\"name\":\"2010 International Students and Young Scientists Workshop \\\"Photonics and Microsystems\\\"\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 International Students and Young Scientists Workshop \\\"Photonics and Microsystems\\\"\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STYSW.2010.5714160\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STYSW.2010.5714160","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy
In the modern world, the influence the optoelectronic devices on the communications methods are still increasing. Therefore it is very important to find appropriate techniques for design, building, testing, measuring and packaging.
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