{"title":"一种利用微波传输线不连续特性表征导电聚合物的宽带新方法","authors":"J. Abdulnour, C. Akyel, K. Wu","doi":"10.1109/CCECE.1995.528147","DOIUrl":null,"url":null,"abstract":"A new approach to measurement of the dielectric permittivity is proposed, using a discontinuity in a microstrip line or rectangular waveguide. A contour integral method is used in the first instance to calculate the S-parameters with knowledge of the permittivity (direct problem). Diagrams relating the dielectric constant to the S-parameter are obtained and a simple analytical expression is deduced for solution of the inverse problem.","PeriodicalId":158581,"journal":{"name":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new broadband method of characterisation of conductive polymers using discontinuities in microwave transmission lines\",\"authors\":\"J. Abdulnour, C. Akyel, K. Wu\",\"doi\":\"10.1109/CCECE.1995.528147\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new approach to measurement of the dielectric permittivity is proposed, using a discontinuity in a microstrip line or rectangular waveguide. A contour integral method is used in the first instance to calculate the S-parameters with knowledge of the permittivity (direct problem). Diagrams relating the dielectric constant to the S-parameter are obtained and a simple analytical expression is deduced for solution of the inverse problem.\",\"PeriodicalId\":158581,\"journal\":{\"name\":\"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering\",\"volume\":\"67 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.1995.528147\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.1995.528147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new broadband method of characterisation of conductive polymers using discontinuities in microwave transmission lines
A new approach to measurement of the dielectric permittivity is proposed, using a discontinuity in a microstrip line or rectangular waveguide. A contour integral method is used in the first instance to calculate the S-parameters with knowledge of the permittivity (direct problem). Diagrams relating the dielectric constant to the S-parameter are obtained and a simple analytical expression is deduced for solution of the inverse problem.
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