{"title":"靠近衬底和地平面边缘的微带线色散特性的有限元分析","authors":"B. R. Crain, A. Peterson","doi":"10.1109/ISEMC.1996.561410","DOIUrl":null,"url":null,"abstract":"The dispersion characteristics of microstrip lines lying near substrate and ground plane edges are examined using the finite element method (FEM). Microstrips lying near two types of edges are analyzed: a substrate edge on an infinite ground plane and a substrate/ground plane edge. The FEM formulation is based on the curl-curl vector Helmholtz equation. Mixed-order covariant projection finite elements are employed to avoid problems with spurious modes. Local absorbing boundary conditions are used to truncate the FEM mesh in the open region. An efficient sparse eigensolver, based on iterative methods, is used to solve the resulting non-linear eigenvalue equation.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"148 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Finite element analysis of dispersion characteristics of microstrip lines lying near substrate and ground plane edges\",\"authors\":\"B. R. Crain, A. Peterson\",\"doi\":\"10.1109/ISEMC.1996.561410\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The dispersion characteristics of microstrip lines lying near substrate and ground plane edges are examined using the finite element method (FEM). Microstrips lying near two types of edges are analyzed: a substrate edge on an infinite ground plane and a substrate/ground plane edge. The FEM formulation is based on the curl-curl vector Helmholtz equation. Mixed-order covariant projection finite elements are employed to avoid problems with spurious modes. Local absorbing boundary conditions are used to truncate the FEM mesh in the open region. An efficient sparse eigensolver, based on iterative methods, is used to solve the resulting non-linear eigenvalue equation.\",\"PeriodicalId\":296175,\"journal\":{\"name\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"volume\":\"148 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1996.561410\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1996.561410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Finite element analysis of dispersion characteristics of microstrip lines lying near substrate and ground plane edges
The dispersion characteristics of microstrip lines lying near substrate and ground plane edges are examined using the finite element method (FEM). Microstrips lying near two types of edges are analyzed: a substrate edge on an infinite ground plane and a substrate/ground plane edge. The FEM formulation is based on the curl-curl vector Helmholtz equation. Mixed-order covariant projection finite elements are employed to avoid problems with spurious modes. Local absorbing boundary conditions are used to truncate the FEM mesh in the open region. An efficient sparse eigensolver, based on iterative methods, is used to solve the resulting non-linear eigenvalue equation.
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