{"title":"相干射频误差统计","authors":"R. Dybdal, R. Ott","doi":"10.1109/MWSYM.1986.1132279","DOIUrl":null,"url":null,"abstract":"RF error statistics for power, voltage, and phase are presented for an error component which is coherently related to a desired signal. The error component is assumed to have a constant magnitude and a phase distribution which is equally likely and uniformly distributed from 0 to 360°. The statistics which result have non-zero mean values for power and voltage errors and the standard deviation of the errors differ significantly from those projected from Gaussian statistics.","PeriodicalId":109161,"journal":{"name":"1986 IEEE MTT-S International Microwave Symposium Digest","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Coherent RF Error Statistics\",\"authors\":\"R. Dybdal, R. Ott\",\"doi\":\"10.1109/MWSYM.1986.1132279\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"RF error statistics for power, voltage, and phase are presented for an error component which is coherently related to a desired signal. The error component is assumed to have a constant magnitude and a phase distribution which is equally likely and uniformly distributed from 0 to 360°. The statistics which result have non-zero mean values for power and voltage errors and the standard deviation of the errors differ significantly from those projected from Gaussian statistics.\",\"PeriodicalId\":109161,\"journal\":{\"name\":\"1986 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1986.1132279\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1986.1132279","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
RF error statistics for power, voltage, and phase are presented for an error component which is coherently related to a desired signal. The error component is assumed to have a constant magnitude and a phase distribution which is equally likely and uniformly distributed from 0 to 360°. The statistics which result have non-zero mean values for power and voltage errors and the standard deviation of the errors differ significantly from those projected from Gaussian statistics.
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