衬底寄生效应对CE和CB SiGe HBTs功率增益关系的影响

Hai Huang, Z. Ma, P. Ma, M. Rananelli
{"title":"衬底寄生效应对CE和CB SiGe HBTs功率增益关系的影响","authors":"Hai Huang, Z. Ma, P. Ma, M. Rananelli","doi":"10.1109/SMIC.2008.22","DOIUrl":null,"url":null,"abstract":"The impact of substrate parasitic effects on the power gain relation between the CE and CB configurations of low-power SiGe HBTs has been analyzed. In comparison to large-area power SiGe HBTs, the speed and small-signal power gain of the device are much higher. Nevertheless, the relative parasitic effects on these small devices are much stronger than that on the large ones. It is found that due to the influence of substrate parasitic effects (input and output coupling between input and output pads), the power gain of CB SiGe HBTs can be dramatically degraded, while the power gain of CE SiGe HBTs is not affected much. The consequence of the different influences of parasitic effects on CE and CB SiGe HBTs is that the intrinsic higher power gain of the CB SiGe HBT than the CE device is lost, which is verified by measurements. Based on the detailed analysis of the substrate parasitic effects, an approach to restoring the superior power gain characteristics of CB SiGe HBTs is proposed.","PeriodicalId":350325,"journal":{"name":"2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Influence of Substrate Parasitic Effects on Power Gain Relation Between CE and CB SiGe HBTs\",\"authors\":\"Hai Huang, Z. Ma, P. Ma, M. Rananelli\",\"doi\":\"10.1109/SMIC.2008.22\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The impact of substrate parasitic effects on the power gain relation between the CE and CB configurations of low-power SiGe HBTs has been analyzed. In comparison to large-area power SiGe HBTs, the speed and small-signal power gain of the device are much higher. Nevertheless, the relative parasitic effects on these small devices are much stronger than that on the large ones. It is found that due to the influence of substrate parasitic effects (input and output coupling between input and output pads), the power gain of CB SiGe HBTs can be dramatically degraded, while the power gain of CE SiGe HBTs is not affected much. The consequence of the different influences of parasitic effects on CE and CB SiGe HBTs is that the intrinsic higher power gain of the CB SiGe HBT than the CE device is lost, which is verified by measurements. Based on the detailed analysis of the substrate parasitic effects, an approach to restoring the superior power gain characteristics of CB SiGe HBTs is proposed.\",\"PeriodicalId\":350325,\"journal\":{\"name\":\"2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMIC.2008.22\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMIC.2008.22","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

分析了衬底寄生效应对低功率SiGe HBTs的CE和CB结构之间功率增益关系的影响。与大面积功率SiGe hbt相比,该器件的速度和小信号功率增益要高得多。然而,这些小型设备的相对寄生效应要比大型设备强得多。研究发现,由于衬底寄生效应(输入输出焊盘之间的输入输出耦合)的影响,CB SiGe HBTs的功率增益会急剧下降,而CE SiGe HBTs的功率增益则不会受到太大影响。寄生效应对CE和CB SiGe HBT的不同影响导致CB SiGe HBT比CE器件固有更高的功率增益损失,这一点通过测量得到验证。在详细分析衬底寄生效应的基础上,提出了一种恢复CB SiGe HBTs优越功率增益特性的方法。
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Influence of Substrate Parasitic Effects on Power Gain Relation Between CE and CB SiGe HBTs
The impact of substrate parasitic effects on the power gain relation between the CE and CB configurations of low-power SiGe HBTs has been analyzed. In comparison to large-area power SiGe HBTs, the speed and small-signal power gain of the device are much higher. Nevertheless, the relative parasitic effects on these small devices are much stronger than that on the large ones. It is found that due to the influence of substrate parasitic effects (input and output coupling between input and output pads), the power gain of CB SiGe HBTs can be dramatically degraded, while the power gain of CE SiGe HBTs is not affected much. The consequence of the different influences of parasitic effects on CE and CB SiGe HBTs is that the intrinsic higher power gain of the CB SiGe HBT than the CE device is lost, which is verified by measurements. Based on the detailed analysis of the substrate parasitic effects, an approach to restoring the superior power gain characteristics of CB SiGe HBTs is proposed.
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