{"title":"电子工艺产量有限","authors":"G. Maier, Shawn Smith","doi":"10.1109/ISQED.2000.838924","DOIUrl":null,"url":null,"abstract":"Today's industry is expanding the high performance microprocessor market into the consumer market place. This market requires very low cost, high reliability, stricter SPQL levels, and very high yields. A New Diagnostic Methodology is required to meet these new demands. This paper addresses a broad scope of issues from Product Design and Manufacturing Test, to Diagnostic and Data Analysis Tools. It describes a beta test case currently in operation on IBM's latest PowerPC products in their copper and SOI technologies.","PeriodicalId":113766,"journal":{"name":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Electronic process limited yield\",\"authors\":\"G. Maier, Shawn Smith\",\"doi\":\"10.1109/ISQED.2000.838924\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Today's industry is expanding the high performance microprocessor market into the consumer market place. This market requires very low cost, high reliability, stricter SPQL levels, and very high yields. A New Diagnostic Methodology is required to meet these new demands. This paper addresses a broad scope of issues from Product Design and Manufacturing Test, to Diagnostic and Data Analysis Tools. It describes a beta test case currently in operation on IBM's latest PowerPC products in their copper and SOI technologies.\",\"PeriodicalId\":113766,\"journal\":{\"name\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-03-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2000.838924\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2000.838924","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Today's industry is expanding the high performance microprocessor market into the consumer market place. This market requires very low cost, high reliability, stricter SPQL levels, and very high yields. A New Diagnostic Methodology is required to meet these new demands. This paper addresses a broad scope of issues from Product Design and Manufacturing Test, to Diagnostic and Data Analysis Tools. It describes a beta test case currently in operation on IBM's latest PowerPC products in their copper and SOI technologies.
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