双端口VNA硬件特性导致测量偏差的推导

Nan Sun, H.-W. Deng, Fengting Yin
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引用次数: 1

摘要

本文确定了受实际矢量网络分析仪(VNA)硬件特性影响的偏差贡献。基于广泛的短时开放负载通过(SOLT) 12项误差模型,将原始测量值和最终测量值视为误差项的多元函数,将误差项理想值附近的泰勒级数的线性项作为误差的合理估计。因此,将校正步骤中得到的误差项的计算值和理想值替换为这些项对原始和最终测量结果的偏差贡献。使用两个不同的VNAs (Keysight 5227A和Ceyear 3671E)测量被测网络,具有已知参数,服务于相同的校准步骤。在研究中,反射跟踪误差对原始测量值的影响最大,但只有负载不匹配误差才是最终测量值的偏差贡献者。通过对测量结果的比较,验证了该方法的正确性和有效性。
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Derivation of The Measurement Deviations Caused by Two-Port VNA Hardware Features
In this paper, the deviation contributions influenced by actual vector network analyzer (VNA) hardware features are determined. The raw and final measured values are regarded as multivariate functions of the error terms based on the widespread short-open-load-thru (SOLT) 12-term error model, with the linear terms of Taylor’s series near the ideal values of the error terms taken as reasonable estimations of the error. The calculated and ideal values of the error terms obtained in calibration steps are hence substituted to derive the deviation contributions of those terms to the raw and final measurement result. Two different VNAs (Keysight 5227A and Ceyear 3671E) are utilized to measure the network under test with known parameters serving the same calibration steps. In the research, reflection tracking error has the greatest influence on the raw measured values, but only the load mismatch error is a deviation contributor to the final measured values. The correctness and effectiveness of the method are verified by comparing the measurement results.
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