通过对电路包维修数据的分析,提高电路包的制造成品率

S. Chang
{"title":"通过对电路包维修数据的分析,提高电路包的制造成品率","authors":"S. Chang","doi":"10.1109/IEMC.1990.201258","DOIUrl":null,"url":null,"abstract":"A large share of electronic system manufacturing cost is related to the process of assembly, diagnosis, and circuit board repair. To enhance the circuit pack diagnosis accuracy and efficiency, and the yield of product, two analysis methods based on the repair data collected by a computer-integrated manufacturing system have been devised. One is test program evaluation, and the other is detailed circuit pack failure mode analysis. The main purpose is to reduce the total cost of product and enhance the quality. Currently, tools for analyzing test programs and detailed FMA for circuit codes have been installed in four AT&T manufacturing locations and interfaced with other AT&T internal software systems.<<ETX>>","PeriodicalId":235761,"journal":{"name":"IEEE International Conference on Engineering Management, Gaining the Competitive Advantage","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improving the circuit pack manufacturing yield by the methods of analyzing the circuit pack repair data\",\"authors\":\"S. Chang\",\"doi\":\"10.1109/IEMC.1990.201258\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A large share of electronic system manufacturing cost is related to the process of assembly, diagnosis, and circuit board repair. To enhance the circuit pack diagnosis accuracy and efficiency, and the yield of product, two analysis methods based on the repair data collected by a computer-integrated manufacturing system have been devised. One is test program evaluation, and the other is detailed circuit pack failure mode analysis. The main purpose is to reduce the total cost of product and enhance the quality. Currently, tools for analyzing test programs and detailed FMA for circuit codes have been installed in four AT&T manufacturing locations and interfaced with other AT&T internal software systems.<<ETX>>\",\"PeriodicalId\":235761,\"journal\":{\"name\":\"IEEE International Conference on Engineering Management, Gaining the Competitive Advantage\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-10-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Conference on Engineering Management, Gaining the Competitive Advantage\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMC.1990.201258\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Conference on Engineering Management, Gaining the Competitive Advantage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMC.1990.201258","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

电子系统制造成本的很大一部分与组装、诊断和电路板维修过程有关。为了提高电路包诊断的准确性和效率,提高产品的成品率,设计了两种基于计算机集成制造系统采集的维修数据的分析方法。一个是测试程序评估,另一个是详细的电路包失效模式分析。其主要目的是降低产品总成本,提高产品质量。目前,用于分析测试程序和电路代码详细FMA的工具已安装在AT&T的四个制造地点,并与AT&T的其他内部软件系统接口
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Improving the circuit pack manufacturing yield by the methods of analyzing the circuit pack repair data
A large share of electronic system manufacturing cost is related to the process of assembly, diagnosis, and circuit board repair. To enhance the circuit pack diagnosis accuracy and efficiency, and the yield of product, two analysis methods based on the repair data collected by a computer-integrated manufacturing system have been devised. One is test program evaluation, and the other is detailed circuit pack failure mode analysis. The main purpose is to reduce the total cost of product and enhance the quality. Currently, tools for analyzing test programs and detailed FMA for circuit codes have been installed in four AT&T manufacturing locations and interfaced with other AT&T internal software systems.<>
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