{"title":"可靠性试验数据的扩展分析","authors":"T. Papanchev, J. Garipova","doi":"10.1109/ET50336.2020.9238212","DOIUrl":null,"url":null,"abstract":"This paper discusses the possibilities for detecting and evaluating additional information on the influence of various stressors on electronic devices when data from two-sreess factors accelerated tests are collected. Two approaches are considered - standard, with one fixed stress factor, and estimation by severity of impact by solving partial differential equations.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An Extended Analysis of Reliability Test Data\",\"authors\":\"T. Papanchev, J. Garipova\",\"doi\":\"10.1109/ET50336.2020.9238212\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the possibilities for detecting and evaluating additional information on the influence of various stressors on electronic devices when data from two-sreess factors accelerated tests are collected. Two approaches are considered - standard, with one fixed stress factor, and estimation by severity of impact by solving partial differential equations.\",\"PeriodicalId\":178356,\"journal\":{\"name\":\"2020 XXIX International Scientific Conference Electronics (ET)\",\"volume\":\"110 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 XXIX International Scientific Conference Electronics (ET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ET50336.2020.9238212\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 XXIX International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET50336.2020.9238212","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper discusses the possibilities for detecting and evaluating additional information on the influence of various stressors on electronic devices when data from two-sreess factors accelerated tests are collected. Two approaches are considered - standard, with one fixed stress factor, and estimation by severity of impact by solving partial differential equations.
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