{"title":"电路公差分析中真最坏情况评定的新方法。1 .用遗传算法计算内解","authors":"L. Egiziano, N. Femia, G. Spagnuolo","doi":"10.1109/CIPE.1998.779670","DOIUrl":null,"url":null,"abstract":"A new approach to the calculation of the true worst-case in circuit tolerance analysis (TWC-CTA) based on a genetic algorithm is presented in this paper. The GA solves the problem of minimizing the intrinsic underestimation error which affects stochastic methods in the calculation of the TWC with parameters characterized by large uncertainties. The joint application of the technique presented in this paper and in part II for the calculation of an overestimated solution ensures a reliable and efficient TWC evaluation.","PeriodicalId":250682,"journal":{"name":"COM.P.EL.98. Record 6th Workshop on Computer in Power Electronics (Cat. No.98TH8358)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"New approaches to the true worst-case evaluation in circuit tolerance analysis. I. Calculation of the inner solution by genetic algorithms\",\"authors\":\"L. Egiziano, N. Femia, G. Spagnuolo\",\"doi\":\"10.1109/CIPE.1998.779670\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new approach to the calculation of the true worst-case in circuit tolerance analysis (TWC-CTA) based on a genetic algorithm is presented in this paper. The GA solves the problem of minimizing the intrinsic underestimation error which affects stochastic methods in the calculation of the TWC with parameters characterized by large uncertainties. The joint application of the technique presented in this paper and in part II for the calculation of an overestimated solution ensures a reliable and efficient TWC evaluation.\",\"PeriodicalId\":250682,\"journal\":{\"name\":\"COM.P.EL.98. Record 6th Workshop on Computer in Power Electronics (Cat. No.98TH8358)\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-07-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"COM.P.EL.98. Record 6th Workshop on Computer in Power Electronics (Cat. No.98TH8358)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CIPE.1998.779670\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"COM.P.EL.98. Record 6th Workshop on Computer in Power Electronics (Cat. No.98TH8358)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIPE.1998.779670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New approaches to the true worst-case evaluation in circuit tolerance analysis. I. Calculation of the inner solution by genetic algorithms
A new approach to the calculation of the true worst-case in circuit tolerance analysis (TWC-CTA) based on a genetic algorithm is presented in this paper. The GA solves the problem of minimizing the intrinsic underestimation error which affects stochastic methods in the calculation of the TWC with parameters characterized by large uncertainties. The joint application of the technique presented in this paper and in part II for the calculation of an overestimated solution ensures a reliable and efficient TWC evaluation.