片上系统设计的自动调试

Frank Rogin, R. Drechsler, Steffen Rülke
{"title":"片上系统设计的自动调试","authors":"Frank Rogin, R. Drechsler, Steffen Rülke","doi":"10.1109/SOCCON.2009.5398027","DOIUrl":null,"url":null,"abstract":"Designing system-on-a-chip (SoC) using system-level languages is becoming a standard in industry. However, the non-deterministic semantics of such parallel languages could yield failures that are hard to debug. In this paper, we present a new approach that supports automatic debugging of SoC designs written in SystemC using a method that isolates failure-inducing process schedules.","PeriodicalId":303505,"journal":{"name":"2009 IEEE International SOC Conference (SOCC)","volume":"255 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Automatic debugging of System-on-a-Chip designs\",\"authors\":\"Frank Rogin, R. Drechsler, Steffen Rülke\",\"doi\":\"10.1109/SOCCON.2009.5398027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Designing system-on-a-chip (SoC) using system-level languages is becoming a standard in industry. However, the non-deterministic semantics of such parallel languages could yield failures that are hard to debug. In this paper, we present a new approach that supports automatic debugging of SoC designs written in SystemC using a method that isolates failure-inducing process schedules.\",\"PeriodicalId\":303505,\"journal\":{\"name\":\"2009 IEEE International SOC Conference (SOCC)\",\"volume\":\"255 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE International SOC Conference (SOCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOCCON.2009.5398027\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International SOC Conference (SOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOCCON.2009.5398027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

使用系统级语言设计片上系统(SoC)正在成为工业标准。然而,这种并行语言的非确定性语义可能导致难以调试的故障。在本文中,我们提出了一种新的方法,该方法支持用SystemC编写的SoC设计的自动调试,该方法使用隔离故障诱导进程调度的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Automatic debugging of System-on-a-Chip designs
Designing system-on-a-chip (SoC) using system-level languages is becoming a standard in industry. However, the non-deterministic semantics of such parallel languages could yield failures that are hard to debug. In this paper, we present a new approach that supports automatic debugging of SoC designs written in SystemC using a method that isolates failure-inducing process schedules.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A novel high-efficiency partial-parallel context modeling architecture for EBCOT in JPEG2000 Low-distortion double-sampling ΔΣ ADC using a direct-charge-transfer adder Low power RS codec using cell-based reconfigurable processor Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications RF-MEMS resonator design for parameter characterization
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1