基于多电平Si IGBT和2电平SiC MOSFET逆变器的长电缆高速驱动器的运行分析与比较

J. Loncarski, V. Monopoli, R. Leuzzi, F. Cupertino
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引用次数: 5

摘要

碳化硅(SiC) mosfet作为一种宽带隙半导体器件,越来越受到人们的青睐。与硅(Si)相比,它们可以以更高的频率切换,并且可以提供高速电力驱动。高速机器在航空或电动汽车应用中得到了有益的应用,大大减少了负担和重量。另一方面,工业电机驱动器通常包括一个长屏蔽电缆连接逆变器到感应电机。这一点,再加上SiC器件的高频工作,强调了寄生效应(如杂散电感和电容)的影响,从而在电机端子上产生反射波瞬态过电压。本文系统地研究了SiC mosfet的开关性能,并将其与用于低压感应电机负载的Si器件的开关性能进行了比较。对于硅基逆变器配置,选择了中性点箝位(NPC) 3电平逆变器,因为它在工业应用中利用率很高。这两种系统在相同输出电压能力下的开关性能、过电压和功率损耗方面进行了比较。利用电源开关模块的实际模型进行了仿真。目的是分析改善开关性能和减少反射波的潜在解决方案,以及未来对电老化现象的分析。
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Operation analysis and comparison of Multilevel Si IGBT and 2-level SiC MOSFET inverter-based high-speed drives with long power cable
Silicon Carbide (SiC) MOSFETs, as wide-bandgap semiconductor device, are becoming increasingly popular. They can switch at much higher frequency when compared to their silicon (Si) counterparts and can viably supply high-speed electrical drives. High-speed machines are profitably used in aeronautical or electric vehicle applications, offering drastic reduction of encumbrance and weight. On the other hand, industrial motor drives usually include a long-shielded cable to connect the inverter to the induction motor. This, together with high frequency operation of the SiC devices, emphasizes the effect of parasitics such as stray inductances and capacitances, which generates reflected wave transient overvoltage on motor terminals. In this paper, switching performance of SiC MOSFETs is systematically studied and compared to the performance of Si devices for low-voltage induction motor loads. For the Si-based inverter configuration the Neutral Point Clamped (NPC) 3-level inverter has been chosen, being it highly utilized in industrial applications. The two systems are compared in terms of switching performance, overvoltages, and power losses for the same output voltage capabilities. Simulations are carried out by realistic models of power switch modules. The goal was to analyze potential solutions for switching performance improvement and mitigation of reflected waves, as well as for future analysis of the electric aging phenomena.
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