不同色温白光照射下a-Si:H薄膜晶体管的光学特性

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Circuits Devices & Systems Pub Date : 2022-02-27 DOI:10.1049/cds2.12114
Jui-Hung Chang, Chia-Lun Lee, Fu-Hsing Chen, Chih-Lung Lin
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引用次数: 0

摘要

本研究利用彩色滤光片的透射率和商用白光发光二极管(led)的光谱研究了氢化非晶硅薄膜晶体管(a-Si:H TFTs)的光学特性。使用覆盖和未覆盖滤色器的tft获得的测量光电流的比率与通过滤色器的具有不同色温的白光led的有效照明有关。提出了一个基于这些光电流比率的新因子来评估我们先前开发的白光光电流门控(WPCG)结构的光传感器的输出特性。分析结果表明,所提出的因子和WPCG结构的输出电压彼此高度相关,有利于优化设计参数,以实现在各种条件下高度可靠的光学传感器,用于大型交互式显示器。
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Optical properties of a-Si:H thin-film transistors by illumination by white light with different colour temperatures

This work investigates the optical properties of hydrogenated amorphous silicon thin-film transistors (a-Si:H TFTs) using the transmittances of colour filters and the spectra of commercialised white light-emitting diodes (LEDs). The ratios of the measured photocurrents obtained using the TFTs that are covered and are not covered colour filters are related to the effective illumination from white LEDs with different colour temperatures that pass through the colour filters. A new factor that is based on these ratios of photocurrents is proposed to evaluate the output characteristics of optical sensors with our previously developed white-light photocurrent gating (WPCG) structure. The analytical results demonstrate that the proposed factor and the output voltages of the WPCG structure are highly correlated with each other, favouring the optimisation of the design parameters to realise an optical sensor that is highly reliable under diverse conditions for use in large interactive displays.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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