{"title":"全数字高压fpga诊断设备的实验验证","authors":"J. Tomlain, O. Teren, R. Sedlácek, J. Vedral","doi":"10.1109/NTSP49686.2020.9229545","DOIUrl":null,"url":null,"abstract":"This paper discusses the problems of the noninvasive diagnostic of high-voltage machines. The main role of the diagnostic is to predict an upcoming machine failure. Frequency response and frequency domain spectroscopy methods are studied in this paper. The methods are compared in terms of common instrumentation features. A development of a hardware platform intended for both methods is presented. The platform is evaluated in the terms of accuracy and compared with laboratory instrumentation. The results of the evaluation showed the proposed solution is able to implement both methods and have a measurement accuracy comparable with market available instruments implementing only one method.","PeriodicalId":197079,"journal":{"name":"2020 New Trends in Signal Processing (NTSP)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Experimental Verification of the Fully-Digital High Voltage FPGA-Based Diagnostic Equipment\",\"authors\":\"J. Tomlain, O. Teren, R. Sedlácek, J. Vedral\",\"doi\":\"10.1109/NTSP49686.2020.9229545\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses the problems of the noninvasive diagnostic of high-voltage machines. The main role of the diagnostic is to predict an upcoming machine failure. Frequency response and frequency domain spectroscopy methods are studied in this paper. The methods are compared in terms of common instrumentation features. A development of a hardware platform intended for both methods is presented. The platform is evaluated in the terms of accuracy and compared with laboratory instrumentation. The results of the evaluation showed the proposed solution is able to implement both methods and have a measurement accuracy comparable with market available instruments implementing only one method.\",\"PeriodicalId\":197079,\"journal\":{\"name\":\"2020 New Trends in Signal Processing (NTSP)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 New Trends in Signal Processing (NTSP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NTSP49686.2020.9229545\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 New Trends in Signal Processing (NTSP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NTSP49686.2020.9229545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Experimental Verification of the Fully-Digital High Voltage FPGA-Based Diagnostic Equipment
This paper discusses the problems of the noninvasive diagnostic of high-voltage machines. The main role of the diagnostic is to predict an upcoming machine failure. Frequency response and frequency domain spectroscopy methods are studied in this paper. The methods are compared in terms of common instrumentation features. A development of a hardware platform intended for both methods is presented. The platform is evaluated in the terms of accuracy and compared with laboratory instrumentation. The results of the evaluation showed the proposed solution is able to implement both methods and have a measurement accuracy comparable with market available instruments implementing only one method.