{"title":"CMOS组合电路中的栅极泄漏估计与最小化","authors":"R.S. Guindi","doi":"10.1109/ICM.2003.238361","DOIUrl":null,"url":null,"abstract":"This work presents a methodology for estimating and minimizing the total amount of gate-tunneling current in CMOS combinatorial circuits. We take advantage of the state-dependency exhibited by the gate-leakage and use signal probabilities to optimize internal circuit interconnections. Results are given for a number of ISCAS-85 benchmark circuits.","PeriodicalId":180690,"journal":{"name":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Gate-leakage estimation and minimization in CMOS combinatorial circuits\",\"authors\":\"R.S. Guindi\",\"doi\":\"10.1109/ICM.2003.238361\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a methodology for estimating and minimizing the total amount of gate-tunneling current in CMOS combinatorial circuits. We take advantage of the state-dependency exhibited by the gate-leakage and use signal probabilities to optimize internal circuit interconnections. Results are given for a number of ISCAS-85 benchmark circuits.\",\"PeriodicalId\":180690,\"journal\":{\"name\":\"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2003.238361\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2003.238361","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Gate-leakage estimation and minimization in CMOS combinatorial circuits
This work presents a methodology for estimating and minimizing the total amount of gate-tunneling current in CMOS combinatorial circuits. We take advantage of the state-dependency exhibited by the gate-leakage and use signal probabilities to optimize internal circuit interconnections. Results are given for a number of ISCAS-85 benchmark circuits.