基于脉冲注入锁相技术的无电感级联锁相环

Sang-yeop Lee, Hiroyuki Ito, S. Amakawa, N. Ishihara, K. Masu
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引用次数: 4

摘要

采用90 nm Si CMOS技术,实现了一个具有次谐波脉冲注入锁相的无电感锁相环(锁相环面积0.11 mm2)。所提出的电路配置有两个级联锁相环;其中一个是参考锁相环,它从低频外部参考信号生成参考信号给另一个。另一个是产生高频输出信号的主锁相环。采用高频半积分次谐波锁相技术降低了相位噪声特性。对于50 MHz的输入参考信号,没有注入锁定,在锁相环输出频率为7.2 GHz (= 144 × 50 MHz)时,1 MHz的偏移相位噪声为−88 dBc/Hz;注入锁定时,噪声为−101 dBc/Hz(杂散电平:−31 dBc;1.0 V电源的功耗:25mw)。
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An Inductorless Cascaded Phase-Locked Loop with Pulse Injection Locking Technique in 90 nm CMOS
An inductorless phase-locked loop with subharmonic pulse injection locking was realized (PLL area: 0.11 mm2) by adopting 90 nm Si CMOS technology. The proposed circuit is configured with two cascaded PLLs; one of them is a reference PLL that generates reference signals to the other one from low-frequency external reference signals. The other is a main PLL that generates high-frequency output signals. A high-frequency half-integral subharmonic locking technique was used to decrease the phase noise characteristics. For a 50 MHz input reference signal, without injection locking, the 1 MHz offset phase noise was −88 dBc/Hz at a PLL output frequency of 7.2 GHz (= 144 × 50 MHz); with injection locking, the noise was −101 dBc/Hz (spur level: −31 dBc; power consumption from a 1.0 V power supply: 25 mW).
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