{"title":"一种新的EDA基准生成方法","authors":"M. Kunes, M. Danek","doi":"10.1109/ICM.2003.238304","DOIUrl":null,"url":null,"abstract":"This article introduces a new method for generating benchmark circuits. Common methods of testing physical design algorithms and functional verifications used today rely on standardised sets of widely accepted benchmark circuits, or on generating a random benchmark circuit based on its desired characteristics. Although these approaches are suitable in many situations, sometimes it is advantageous to know an exact function of a benchmark circuit. This article introduces a new method for generating benchmarks that is based on structural modifications of a user-specified design without altering its function. The method uses a set of pre-defined operations on a circuit netlist. The method is demonstrated on several examples.","PeriodicalId":180690,"journal":{"name":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","volume":"117 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Invar-a new approach to EDA benchmark generation\",\"authors\":\"M. Kunes, M. Danek\",\"doi\":\"10.1109/ICM.2003.238304\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article introduces a new method for generating benchmark circuits. Common methods of testing physical design algorithms and functional verifications used today rely on standardised sets of widely accepted benchmark circuits, or on generating a random benchmark circuit based on its desired characteristics. Although these approaches are suitable in many situations, sometimes it is advantageous to know an exact function of a benchmark circuit. This article introduces a new method for generating benchmarks that is based on structural modifications of a user-specified design without altering its function. The method uses a set of pre-defined operations on a circuit netlist. The method is demonstrated on several examples.\",\"PeriodicalId\":180690,\"journal\":{\"name\":\"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)\",\"volume\":\"117 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2003.238304\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2003.238304","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This article introduces a new method for generating benchmark circuits. Common methods of testing physical design algorithms and functional verifications used today rely on standardised sets of widely accepted benchmark circuits, or on generating a random benchmark circuit based on its desired characteristics. Although these approaches are suitable in many situations, sometimes it is advantageous to know an exact function of a benchmark circuit. This article introduces a new method for generating benchmarks that is based on structural modifications of a user-specified design without altering its function. The method uses a set of pre-defined operations on a circuit netlist. The method is demonstrated on several examples.