{"title":"I/sub DDT/ testing","authors":"Yinghua Min, Z. Zhao, Zhongcheng Li","doi":"10.1109/ATS.1997.643986","DOIUrl":null,"url":null,"abstract":"The industry has accepted I/sub DDQ/ testing to detect CMOS IC defects. While I/sub DDT/ testing needs more research to be applicable in practice. However, it is noticed that observing the average transient current can lead to improvements in real defect coverage. This paper presents a formal procedure to identify I/sub DDT/ testable faults, and to generate input vector pairs to detect the faults based on Boolean process. It is interesting to note that those faults may not be detected by I/sub DDQ/ or other test methods, which shows the significance of I/sub DDT/ testing.","PeriodicalId":330767,"journal":{"name":"Proceedings Sixth Asian Test Symposium (ATS'97)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"I/sub DDT/ testing\",\"authors\":\"Yinghua Min, Z. Zhao, Zhongcheng Li\",\"doi\":\"10.1109/ATS.1997.643986\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The industry has accepted I/sub DDQ/ testing to detect CMOS IC defects. While I/sub DDT/ testing needs more research to be applicable in practice. However, it is noticed that observing the average transient current can lead to improvements in real defect coverage. This paper presents a formal procedure to identify I/sub DDT/ testable faults, and to generate input vector pairs to detect the faults based on Boolean process. It is interesting to note that those faults may not be detected by I/sub DDQ/ or other test methods, which shows the significance of I/sub DDT/ testing.\",\"PeriodicalId\":330767,\"journal\":{\"name\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings Sixth Asian Test Symposium (ATS'97)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1997.643986\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Sixth Asian Test Symposium (ATS'97)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1997.643986","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The industry has accepted I/sub DDQ/ testing to detect CMOS IC defects. While I/sub DDT/ testing needs more research to be applicable in practice. However, it is noticed that observing the average transient current can lead to improvements in real defect coverage. This paper presents a formal procedure to identify I/sub DDT/ testable faults, and to generate input vector pairs to detect the faults based on Boolean process. It is interesting to note that those faults may not be detected by I/sub DDQ/ or other test methods, which shows the significance of I/sub DDT/ testing.
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