{"title":"石英晶体精密温度试验台","authors":"R. Kinsman, D. Ryback","doi":"10.1109/FREQ.1989.68882","DOIUrl":null,"url":null,"abstract":"A temperature test station has been developed for testing moderate quantities of crystal resonators. The primary function of this station is to accurately measure the frequency versus temperature characteristics of quartz crystals of all types. Additional features include curve-fitting routines to characterize the frequency-temperature function and the derivation of the crystal's equivalent circuit parameters as a function of temperature. In this system all electrical tests are performed by a network analyzer which interfaces directly with a computer. All functions of the network analyzer are controllable through the computer interface. Crystal measurements are performed with an HP 3577A network analyzer using the general methods outlined in EIA Crystal Measurement Standard 512. This work describes the equipment used in this station and provides a general description of the custom software used to operate the system. Estimates of system accuracy and repeatability are provided. Test results for a variety of crystals are given.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Precision temperature test station for quartz crystals\",\"authors\":\"R. Kinsman, D. Ryback\",\"doi\":\"10.1109/FREQ.1989.68882\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A temperature test station has been developed for testing moderate quantities of crystal resonators. The primary function of this station is to accurately measure the frequency versus temperature characteristics of quartz crystals of all types. Additional features include curve-fitting routines to characterize the frequency-temperature function and the derivation of the crystal's equivalent circuit parameters as a function of temperature. In this system all electrical tests are performed by a network analyzer which interfaces directly with a computer. All functions of the network analyzer are controllable through the computer interface. Crystal measurements are performed with an HP 3577A network analyzer using the general methods outlined in EIA Crystal Measurement Standard 512. This work describes the equipment used in this station and provides a general description of the custom software used to operate the system. Estimates of system accuracy and repeatability are provided. Test results for a variety of crystals are given.<<ETX>>\",\"PeriodicalId\":294361,\"journal\":{\"name\":\"Proceedings of the 43rd Annual Symposium on Frequency Control\",\"volume\":\"60 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 43rd Annual Symposium on Frequency Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.1989.68882\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1989.68882","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Precision temperature test station for quartz crystals
A temperature test station has been developed for testing moderate quantities of crystal resonators. The primary function of this station is to accurately measure the frequency versus temperature characteristics of quartz crystals of all types. Additional features include curve-fitting routines to characterize the frequency-temperature function and the derivation of the crystal's equivalent circuit parameters as a function of temperature. In this system all electrical tests are performed by a network analyzer which interfaces directly with a computer. All functions of the network analyzer are controllable through the computer interface. Crystal measurements are performed with an HP 3577A network analyzer using the general methods outlined in EIA Crystal Measurement Standard 512. This work describes the equipment used in this station and provides a general description of the custom software used to operate the system. Estimates of system accuracy and repeatability are provided. Test results for a variety of crystals are given.<>