{"title":"集成电路中RFI效应的计算机辅助分析","authors":"J. Whalen, J. Tront, C. Larson, J. Roe","doi":"10.1109/ISEMC.1978.7566830","DOIUrl":null,"url":null,"abstract":"The modified Ebers-Moll model for a bipolar junc tion transistor has been developed for predicting RFI 1-3 effects in bipolar integrated circuits. In this paper it will be shown that the modified Ebers-Moll model can be used with electronic circuit analysis programs such as SPICE (Simulation Program with Inte grated Circuit Emphasis) to provide useful information about RFI effects in digital bipolar integrated 4 circuits.","PeriodicalId":377995,"journal":{"name":"1978 IEEE International Symposium on Electromagnetic Compatibility","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1978-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Computer-Aided Analysis of RFI Effects in Integrated Circuits\",\"authors\":\"J. Whalen, J. Tront, C. Larson, J. Roe\",\"doi\":\"10.1109/ISEMC.1978.7566830\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The modified Ebers-Moll model for a bipolar junc tion transistor has been developed for predicting RFI 1-3 effects in bipolar integrated circuits. In this paper it will be shown that the modified Ebers-Moll model can be used with electronic circuit analysis programs such as SPICE (Simulation Program with Inte grated Circuit Emphasis) to provide useful information about RFI effects in digital bipolar integrated 4 circuits.\",\"PeriodicalId\":377995,\"journal\":{\"name\":\"1978 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1978-06-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1978 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1978.7566830\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1978 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1978.7566830","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
摘要
改进了双极结晶体管的Ebers-Moll模型，用于预测双极集成电路中的RFI - 1-3效应。本文将证明修正的Ebers-Moll模型可以与SPICE (Simulation Program with integrated circuit Emphasis)等电子电路分析程序一起使用，以提供有关数字双极集成电路中RFI效应的有用信息。
Computer-Aided Analysis of RFI Effects in Integrated Circuits
The modified Ebers-Moll model for a bipolar junc tion transistor has been developed for predicting RFI 1-3 effects in bipolar integrated circuits. In this paper it will be shown that the modified Ebers-Moll model can be used with electronic circuit analysis programs such as SPICE (Simulation Program with Inte grated Circuit Emphasis) to provide useful information about RFI effects in digital bipolar integrated 4 circuits.
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