快速温度循环对铝和金金属系统的影响

13th International Reliability Physics Symposium Pub Date : 1975-04-01 DOI:10.1109/IRPS.1975.362684

A. Macpherson, W. Weisenberger, H. Day, A. Christou

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引用次数: 4

摘要

雷达系统中的微波功率晶体管在寿命周期内可经历约1011次快速加热和冷却循环。控制温度循环测试已经进行了铝，钝化铝和金金属化系统使用两个特殊的测试模式和市售晶体管。在铝、玻璃化铝和实验室Ta-Pt-Ta-Au系统中观察到显著的可见光和电变化，但在商业金晶体管中没有观察到。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Effects of Fast Temperature Cycling on Aluminum and Gold Metal Systems

Microwave power transistors in a radar-system may undergo ~ 1011 fast heating and cooling cycles during lifetime. Controlled temperature cycling tests have been carried out on Al, passivated Al, and gold metallization systems using both a special test pattern and commercially available transistors. Significant visible and electrical changes were observed for Al, glassed Al and a laboratory Ta-Pt-Ta-Au system, but not for a commercial gold transistor.

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13th International Reliability Physics Symposium

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