硅技术中的GaAs性能:用于混合模拟数字应用的SiGe HBTs

J.M.C. Storkl, D. Harame, B. Meyerson
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引用次数: 0

摘要

只提供摘要形式。回顾SiGe hbt的短暂但成功的历史,从1987年的第一次功能演示到1993年的1 GHz 12位DAC的性能。在完全集成的0.5/0.25 um BiCMOS工艺中提供60 GHz Fmax双极器件,允许在Si技术中实现高性能混合信号应用,实现无与伦比的性能和功能。SiGe晶体管的固有性能已经扩展到115 GHz fT,早期电压为110 V,显示了微波模拟应用的潜力。
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GaAs performance in Si technology: SiGe HBTs for mixed analog-digital applications
Summary form only given. Reviews the short but successful history of SiGe HBTs, from the first functionality demonstration in 1987 to the performance of a 1 GHz, 12-bit DAC in 1993. Availability of 60 GHz Fmax bipolar devices in a fully integrated 0.5/0.25 um BiCMOS process, allows high performance mixed signal applications to be implemented in Si technology, achieving unmatched performance and functionality. The intrinsic performance of SiGe transistors has been extended to 115 GHz fT with an Early voltage of 110 V, demonstrating the potential for microwave analog applications.
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