测量天线散射对辐射电磁场的影响

S. Oing, H. John
{"title":"测量天线散射对辐射电磁场的影响","authors":"S. Oing, H. John","doi":"10.1109/ISEMC.1996.561415","DOIUrl":null,"url":null,"abstract":"The prediction of the radiated electromagnetic field from printed circuit boards and/or parts of electronic systems is dealt with by more and more publications. Numerical techniques such as the method of moments are used to solve highly complex mathematical expressions. The article shows that for simple structures a good compliance with measurement results can be achieved. However, one has to be aware of mismatches of about 20 dB /spl mu/V/m in the specific frequency band, which seems to be caused by incorrect models used in the chosen analysis technique. One possible reason for these mismatches is analysed. The theoretical background is described and illustrated by real benchmarks. The first assumption for the reason of these mismatches is often the inaccuracy of modelling the digital and/or analog devices, but only small changes occur after modifying them. Moreover, it can be stated that in the case of fully theoretical examples, which could be solved for analytically, the compliance between the numerical and analytical solution is nearly perfect. Therefore, we conclude that the measurement environment causes the mismatches.","PeriodicalId":296175,"journal":{"name":"Proceedings of Symposium on Electromagnetic Compatibility","volume":"6 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Influence of measurement antenna scattering on the radiated electromagnetic field\",\"authors\":\"S. Oing, H. John\",\"doi\":\"10.1109/ISEMC.1996.561415\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The prediction of the radiated electromagnetic field from printed circuit boards and/or parts of electronic systems is dealt with by more and more publications. Numerical techniques such as the method of moments are used to solve highly complex mathematical expressions. The article shows that for simple structures a good compliance with measurement results can be achieved. However, one has to be aware of mismatches of about 20 dB /spl mu/V/m in the specific frequency band, which seems to be caused by incorrect models used in the chosen analysis technique. One possible reason for these mismatches is analysed. The theoretical background is described and illustrated by real benchmarks. The first assumption for the reason of these mismatches is often the inaccuracy of modelling the digital and/or analog devices, but only small changes occur after modifying them. Moreover, it can be stated that in the case of fully theoretical examples, which could be solved for analytically, the compliance between the numerical and analytical solution is nearly perfect. Therefore, we conclude that the measurement environment causes the mismatches.\",\"PeriodicalId\":296175,\"journal\":{\"name\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"volume\":\"6 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1996.561415\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1996.561415","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

印制电路板和/或电子系统部件辐射电磁场的预测已被越来越多的出版物所讨论。数值技术如矩量法被用来求解高度复杂的数学表达式。文章表明,对于简单的结构,可以获得与测量结果很好的符合性。然而,人们必须意识到在特定频段中约有20 dB /spl mu/V/m的不匹配,这似乎是由所选择的分析技术中使用的不正确模型引起的。分析了这些不匹配的一个可能原因。理论背景的描述和实际的基准说明。对这些不匹配原因的第一个假设通常是数字和/或模拟设备建模的不准确性,但在修改它们之后只会发生很小的变化。此外,可以这样说,在完全理论的情况下,可以解析求解,数值解与解析解之间的顺应性几乎是完美的。因此,我们得出结论,测量环境导致了不匹配。
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Influence of measurement antenna scattering on the radiated electromagnetic field
The prediction of the radiated electromagnetic field from printed circuit boards and/or parts of electronic systems is dealt with by more and more publications. Numerical techniques such as the method of moments are used to solve highly complex mathematical expressions. The article shows that for simple structures a good compliance with measurement results can be achieved. However, one has to be aware of mismatches of about 20 dB /spl mu/V/m in the specific frequency band, which seems to be caused by incorrect models used in the chosen analysis technique. One possible reason for these mismatches is analysed. The theoretical background is described and illustrated by real benchmarks. The first assumption for the reason of these mismatches is often the inaccuracy of modelling the digital and/or analog devices, but only small changes occur after modifying them. Moreover, it can be stated that in the case of fully theoretical examples, which could be solved for analytically, the compliance between the numerical and analytical solution is nearly perfect. Therefore, we conclude that the measurement environment causes the mismatches.
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Development of an embedded terminal protection device (TPD) tester 3D-FEM analysis for shielding effects of a metallic enclosure with apertures Analysis on the effectiveness of image planes within a printed circuit board Partial element equivalent circuit (PEEC) method and its application in the frequency and time domain Investigation of the bulk current injection technique by comparison to induced currents from radiated electromagnetic fields
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