测试未来无线世界的挑战

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1271219

Tapio Koivukangas

{"title":"测试未来无线世界的挑战","authors":"Tapio Koivukangas","doi":"10.1109/TEST.2003.1271219","DOIUrl":null,"url":null,"abstract":"This environment is an undoubtedly very complex one containing devices from different product manufacturers (mobile terminals, base stations, wireless applications.. .). The amount of different kind of wireless applications will he huge. This is a big challenge also for testing e.g. how to locate the fault quickly, reliably and accurately and how to ensure interoperahility (IOP) between the devices already in R&D ohase before the actual Droduct launch.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing challenges of future wireless world\",\"authors\":\"Tapio Koivukangas\",\"doi\":\"10.1109/TEST.2003.1271219\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This environment is an undoubtedly very complex one containing devices from different product manufacturers (mobile terminals, base stations, wireless applications.. .). The amount of different kind of wireless applications will he huge. This is a big challenge also for testing e.g. how to locate the fault quickly, reliably and accurately and how to ensure interoperahility (IOP) between the devices already in R&D ohase before the actual Droduct launch.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1271219\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1271219","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

这个环境无疑是一个非常复杂的环境，包含来自不同产品制造商的设备(移动终端、基站、无线应用程序……)。不同种类的无线应用的数量将是巨大的。这对于测试来说也是一个巨大的挑战，例如如何快速、可靠和准确地定位故障，以及如何确保在实际产品发布之前已经处于研发阶段的设备之间的互操作性(IOP)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Testing challenges of future wireless world

This environment is an undoubtedly very complex one containing devices from different product manufacturers (mobile terminals, base stations, wireless applications.. .). The amount of different kind of wireless applications will he huge. This is a big challenge also for testing e.g. how to locate the fault quickly, reliably and accurately and how to ensure interoperahility (IOP) between the devices already in R&D ohase before the actual Droduct launch.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

International Test Conference, 2003. Proceedings. ITC 2003.

自引率

0.00%

发文量

期刊最新文献

Fault pattern oriented defect diagnosis for memories A built-in self-repair scheme for semiconductor memories with 2-d redundancy Cost-effective approach for reducing soft error failure rate in logic circuits A new maximal diagnosis algorithm for bus-structured systems Test vector generation based on correlation model for ratio-I/sub DDQ/