Giorgi Maghlakelidze, Pengyu Wei, Wei Huang, H. Gossner, D. Pommerenke
{"title":"使用全自动设置的引脚特定ESD软故障表征","authors":"Giorgi Maghlakelidze, Pengyu Wei, Wei Huang, H. Gossner, D. Pommerenke","doi":"10.23919/EOS/ESD.2018.8509693","DOIUrl":null,"url":null,"abstract":"A fully automated system is developed for the systematic characterization of soft failure robustness for a DUT. The methodology is founded on software-based detection methods and applied to a USB3 interface. The approach is extendable to other interfaces and measurement-based failure detection methods.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Pin Specific ESD Soft Failure Characterization Using a Fully Automated Set-up\",\"authors\":\"Giorgi Maghlakelidze, Pengyu Wei, Wei Huang, H. Gossner, D. Pommerenke\",\"doi\":\"10.23919/EOS/ESD.2018.8509693\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A fully automated system is developed for the systematic characterization of soft failure robustness for a DUT. The methodology is founded on software-based detection methods and applied to a USB3 interface. The approach is extendable to other interfaces and measurement-based failure detection methods.\",\"PeriodicalId\":328499,\"journal\":{\"name\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EOS/ESD.2018.8509693\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509693","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Pin Specific ESD Soft Failure Characterization Using a Fully Automated Set-up
A fully automated system is developed for the systematic characterization of soft failure robustness for a DUT. The methodology is founded on software-based detection methods and applied to a USB3 interface. The approach is extendable to other interfaces and measurement-based failure detection methods.