含损耗导体平面电路中慢波效应的全波分析

1994 24th European Microwave Conference Pub Date : 1994-10-01 DOI:10.1109/EUMA.1994.337358

M. Farina, G. Gerini, T. Rozzi

{"title":"含损耗导体平面电路中慢波效应的全波分析","authors":"M. Farina, G. Gerini, T. Rozzi","doi":"10.1109/EUMA.1994.337358","DOIUrl":null,"url":null,"abstract":"In this contribution we provide a full-wave analysis of the effect of conductor losses in MIS and Schottky junction devices. This rigorous treatment explains the fundamental mechanism controlling dispersion in real planar circuits and theoretical data are in good agreement with experimental and FDTD results from other sources.","PeriodicalId":440371,"journal":{"name":"1994 24th European Microwave Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Full Wave Analysis of Slow Wave Effects in Planar Circuits with Lossy Conductors\",\"authors\":\"M. Farina, G. Gerini, T. Rozzi\",\"doi\":\"10.1109/EUMA.1994.337358\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this contribution we provide a full-wave analysis of the effect of conductor losses in MIS and Schottky junction devices. This rigorous treatment explains the fundamental mechanism controlling dispersion in real planar circuits and theoretical data are in good agreement with experimental and FDTD results from other sources.\",\"PeriodicalId\":440371,\"journal\":{\"name\":\"1994 24th European Microwave Conference\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1994 24th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1994.337358\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1994 24th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1994.337358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在这个贡献，我们提供了一个全波分析的影响导体损耗在MIS和肖特基结器件。这种严格的处理解释了实际平面电路中控制色散的基本机制，理论数据与实验和其他来源的时域有限差分结果很好地吻合。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Full Wave Analysis of Slow Wave Effects in Planar Circuits with Lossy Conductors

In this contribution we provide a full-wave analysis of the effect of conductor losses in MIS and Schottky junction devices. This rigorous treatment explains the fundamental mechanism controlling dispersion in real planar circuits and theoretical data are in good agreement with experimental and FDTD results from other sources.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

1994 24th European Microwave Conference

自引率

0.00%

发文量