{"title":"可见光谱区光电二极管的表征","authors":"L. Alves","doi":"10.1109/CPEM.2014.6898529","DOIUrl":null,"url":null,"abstract":"The establishment of the ultraviolet irradiance responsivity scale for the purpose of calibration of commercial UVA and UVB radiometers depends on well-characterized broadband UV radiometers as radiometric scale transfer standards. The UV enhanced silicon photodiodes used for the construction of such transfer standards have been characterized with respect to spectral responsivity and spatial uniformity in the visible spectral region. The shunt resistance of such photodiodes had also been measured.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Characterization of photodiodes in the visible spectral region\",\"authors\":\"L. Alves\",\"doi\":\"10.1109/CPEM.2014.6898529\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The establishment of the ultraviolet irradiance responsivity scale for the purpose of calibration of commercial UVA and UVB radiometers depends on well-characterized broadband UV radiometers as radiometric scale transfer standards. The UV enhanced silicon photodiodes used for the construction of such transfer standards have been characterized with respect to spectral responsivity and spatial uniformity in the visible spectral region. The shunt resistance of such photodiodes had also been measured.\",\"PeriodicalId\":256575,\"journal\":{\"name\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2014.6898529\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2014.6898529","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization of photodiodes in the visible spectral region
The establishment of the ultraviolet irradiance responsivity scale for the purpose of calibration of commercial UVA and UVB radiometers depends on well-characterized broadband UV radiometers as radiometric scale transfer standards. The UV enhanced silicon photodiodes used for the construction of such transfer standards have been characterized with respect to spectral responsivity and spatial uniformity in the visible spectral region. The shunt resistance of such photodiodes had also been measured.
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