哈特曼干涉仪与菲索干涉仪:优缺点

Photonics West - Optoelectronic Materials and Devices Pub Date : 2015-04-06 DOI:10.1117/12.2085263

A. Nikitin, J. Sheldakova, A. Kudryashov, D. Denisov, V. Karasik, A. Sakharov

{"title":"哈特曼干涉仪与菲索干涉仪:优缺点","authors":"A. Nikitin, J. Sheldakova, A. Kudryashov, D. Denisov, V. Karasik, A. Sakharov","doi":"10.1117/12.2085263","DOIUrl":null,"url":null,"abstract":"In this paper we consider two approaches widely used in optical testing: Shack-Hartmann wavefront sensor and Fizeau interferometer technique. Fizeau interferometer that is widely used in optical testing can be easily transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.","PeriodicalId":432115,"journal":{"name":"Photonics West - Optoelectronic Materials and Devices","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Hartmannometer versus Fizeau Interferometer: advantages and drawbacks\",\"authors\":\"A. Nikitin, J. Sheldakova, A. Kudryashov, D. Denisov, V. Karasik, A. Sakharov\",\"doi\":\"10.1117/12.2085263\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we consider two approaches widely used in optical testing: Shack-Hartmann wavefront sensor and Fizeau interferometer technique. Fizeau interferometer that is widely used in optical testing can be easily transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.\",\"PeriodicalId\":432115,\"journal\":{\"name\":\"Photonics West - Optoelectronic Materials and Devices\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Photonics West - Optoelectronic Materials and Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2085263\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photonics West - Optoelectronic Materials and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2085263","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 17

摘要

本文考虑了两种广泛应用于光学检测的方法:夏克-哈特曼波前传感器和菲索干涉仪技术。菲索干涉仪是一种广泛应用于光学测试的仪器，它可以很容易地转换为使用Shack-Hartmann波前传感器的设备，这是一种检测光学元件的替代技术。我们称这种装置为哈特曼干涉仪，并将其特点与菲索干涉仪进行比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Hartmannometer versus Fizeau Interferometer: advantages and drawbacks

In this paper we consider two approaches widely used in optical testing: Shack-Hartmann wavefront sensor and Fizeau interferometer technique. Fizeau interferometer that is widely used in optical testing can be easily transformed to a device using Shack-Hartmann wavefront sensor, the alternative technique to check optical components. We call this device Hartmannometer, and compare its features to those of Fizeau interferometer.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Photonics West - Optoelectronic Materials and Devices

自引率

0.00%

发文量