基于反例的可重构单电子晶体管阵列调试方法

Wenjiao Zeng, Siyi Liu, Yu-Da Chen, Yung-Chih Chen
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引用次数: 0

摘要

提出了一种单电子晶体管阵列的自动调试方法。该方法迭代调用SAT求解器查找反例,并根据反例进行错误识别。它可以修复一个不正确的SET数组,这可以通过改变边缘的配置来纠正。实验结果表明,所提出的调试方法是有效的。它在平均0.021秒内找到不正确SET数组的所有可能的更正。
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A counterexample-based debugging method for reconfigurable single-electron transistor arrays
This paper proposes an automatic debugging method for single-electron transistor arrays. The method iteratively calls a SAT solver to find a counterexample and identify errors based on the counterexample. It can fix an incorrect SET array which can be corrected by changing an edge's configuration. The experimental results show that the proposed debugging method is efficient and effective. It finds all the possible corrections for an incorrect SET array within an average of 0.021 seconds.
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