{"title":"ZnO压敏电阻的降解及其介电弛豫","authors":"H. Wang, Y. Xu","doi":"10.1109/CEIDP.1993.378916","DOIUrl":null,"url":null,"abstract":"Dielectric relaxation spectra are used to study the degradation of a ZnO varistor under 8/20/spl mu/s impulse current. The relationship between dielectric relaxation spectra and the distribution of migration ions is investigated. Dielectric-relaxation measurement is shown to be a reliable method for studying the degradation of non-Ohmic ZnO ceramics. The frequency spectra of dielectric loss are shifted to low-frequency regions after stressing by impulse current. The shift is attributed to the formation of equivalent dipoles in the grain boundary by the migration of interstitials.<<ETX>>","PeriodicalId":149803,"journal":{"name":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Degradation of ZnO varistor and its dielectric relaxation\",\"authors\":\"H. Wang, Y. Xu\",\"doi\":\"10.1109/CEIDP.1993.378916\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dielectric relaxation spectra are used to study the degradation of a ZnO varistor under 8/20/spl mu/s impulse current. The relationship between dielectric relaxation spectra and the distribution of migration ions is investigated. Dielectric-relaxation measurement is shown to be a reliable method for studying the degradation of non-Ohmic ZnO ceramics. The frequency spectra of dielectric loss are shifted to low-frequency regions after stressing by impulse current. The shift is attributed to the formation of equivalent dipoles in the grain boundary by the migration of interstitials.<<ETX>>\",\"PeriodicalId\":149803,\"journal\":{\"name\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1993.378916\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1993.378916","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Degradation of ZnO varistor and its dielectric relaxation
Dielectric relaxation spectra are used to study the degradation of a ZnO varistor under 8/20/spl mu/s impulse current. The relationship between dielectric relaxation spectra and the distribution of migration ions is investigated. Dielectric-relaxation measurement is shown to be a reliable method for studying the degradation of non-Ohmic ZnO ceramics. The frequency spectra of dielectric loss are shifted to low-frequency regions after stressing by impulse current. The shift is attributed to the formation of equivalent dipoles in the grain boundary by the migration of interstitials.<>
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