一种用于微处理器内核测试和硅调试的I-IP

P. Bernardi, M. Grosso, M. Rebaudengo, M. Reorda
{"title":"一种用于微处理器内核测试和硅调试的I-IP","authors":"P. Bernardi, M. Grosso, M. Rebaudengo, M. Reorda","doi":"10.1109/MTV.2005.11","DOIUrl":null,"url":null,"abstract":"Semiconductor manufacturers aim at delivering new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time-to-market. In this paper we propose an Infrastructure IP (I-IP) intended to be a companion for processor cores. The proposed I-IP is an efficient, low-cost and easy-to-adopt solution for supporting the silicon debug of microprocessor cores and of other cores in a SoC, as it reuses the hardware introduced for implementing processor software-based self test (SBST)","PeriodicalId":179953,"journal":{"name":"2005 Sixth International Workshop on Microprocessor Test and Verification","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2005-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores\",\"authors\":\"P. Bernardi, M. Grosso, M. Rebaudengo, M. Reorda\",\"doi\":\"10.1109/MTV.2005.11\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Semiconductor manufacturers aim at delivering new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time-to-market. In this paper we propose an Infrastructure IP (I-IP) intended to be a companion for processor cores. The proposed I-IP is an efficient, low-cost and easy-to-adopt solution for supporting the silicon debug of microprocessor cores and of other cores in a SoC, as it reuses the hardware introduced for implementing processor software-based self test (SBST)\",\"PeriodicalId\":179953,\"journal\":{\"name\":\"2005 Sixth International Workshop on Microprocessor Test and Verification\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-11-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 Sixth International Workshop on Microprocessor Test and Verification\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTV.2005.11\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 Sixth International Workshop on Microprocessor Test and Verification","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTV.2005.11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

半导体制造商的目标是在更短的时间内交付新设备,以获得市场份额。首先,为了缩短产品上市时间,芯片调试是一个重要的问题。在本文中,我们提出了一个基础架构IP (I-IP),旨在成为处理器核心的伴侣。所提出的I-IP是一种高效,低成本和易于采用的解决方案,用于支持微处理器内核和SoC中其他内核的硅调试,因为它重用了用于实现基于处理器软件的自检(SBST)的硬件。
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Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Semiconductor manufacturers aim at delivering new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time-to-market. In this paper we propose an Infrastructure IP (I-IP) intended to be a companion for processor cores. The proposed I-IP is an efficient, low-cost and easy-to-adopt solution for supporting the silicon debug of microprocessor cores and of other cores in a SoC, as it reuses the hardware introduced for implementing processor software-based self test (SBST)
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