{"title":"太赫兹时域光谱学(从100ghz到2thz)的计量测量","authors":"M. Charles, D. Allal","doi":"10.1109/CPEM.2014.6898318","DOIUrl":null,"url":null,"abstract":"Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Metrological measurements in terahertz time-domain spectroscopy at LNE (from 100 GHz to 2 THz)\",\"authors\":\"M. Charles, D. Allal\",\"doi\":\"10.1109/CPEM.2014.6898318\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.\",\"PeriodicalId\":256575,\"journal\":{\"name\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2014.6898318\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2014.6898318","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Metrological measurements in terahertz time-domain spectroscopy at LNE (from 100 GHz to 2 THz)
Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.
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