{"title":"近似参数故障诊断","authors":"Z. Kincl, Z. Kolka","doi":"10.1109/RADIOELEK.2011.5936449","DOIUrl":null,"url":null,"abstract":"The paper shows a procedure for testing large analog circuits or circuits with parasitic parameters via multi-frequency parametric fault diagnosis. To simplify and accelerate calculations the approximate symbolic analysis is used and unknown tested parameters are analyzed in separate frequency bands. Classification of unknown parameters into frequency bands is based on sensitivities. The proposed procedure is shown on parametric diagnosis of an EMI filter.","PeriodicalId":267447,"journal":{"name":"Proceedings of 21st International Conference Radioelektronika 2011","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Approximate parametric fault diagnosis\",\"authors\":\"Z. Kincl, Z. Kolka\",\"doi\":\"10.1109/RADIOELEK.2011.5936449\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper shows a procedure for testing large analog circuits or circuits with parasitic parameters via multi-frequency parametric fault diagnosis. To simplify and accelerate calculations the approximate symbolic analysis is used and unknown tested parameters are analyzed in separate frequency bands. Classification of unknown parameters into frequency bands is based on sensitivities. The proposed procedure is shown on parametric diagnosis of an EMI filter.\",\"PeriodicalId\":267447,\"journal\":{\"name\":\"Proceedings of 21st International Conference Radioelektronika 2011\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 21st International Conference Radioelektronika 2011\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADIOELEK.2011.5936449\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 21st International Conference Radioelektronika 2011","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADIOELEK.2011.5936449","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The paper shows a procedure for testing large analog circuits or circuits with parasitic parameters via multi-frequency parametric fault diagnosis. To simplify and accelerate calculations the approximate symbolic analysis is used and unknown tested parameters are analyzed in separate frequency bands. Classification of unknown parameters into frequency bands is based on sensitivities. The proposed procedure is shown on parametric diagnosis of an EMI filter.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
