具有自适应死区时间的高频ZVS gan逆变器

B. Kohlhepp, Thomas Foerster, T. Duerbaum
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引用次数: 2

摘要

本文提出了一种零电压开关(ZVS)逆变器和相应的调制方案,该方案在正弦周期内采用可变和固定开关频率工作来限制开关频率范围。它适用于产生正弦输出波形,并确保在整个基频周期内无损切换。在两个开关关闭期间,ZVS需要足够长的死区时间。通常,标准调制方案采用固定的死区时间。第一个实验是用固定死区操作ZVS逆变器。尽管实现了无损开关,但氮化镓半桥开关出现了意想不到的器件高温。这些高温的起源需要弄清楚,以尽量减少功率级的损失。研究表明,在半桥死区,反向传导损失显著。因此,本文介绍了一种自适应死区时间方法,通过将半导体器件外壳温度降低10 K,在实验装置中显示了其有效性。由于这种优化过程的计算工作量相对较高,因此本文最终提出了一种简化的,计算成本更低的变体,在器件温度方面实现了几乎相同的改进。
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High Frequency ZVS GaN-Inverter with Adaptive Dead Time
This paper presents a zero voltage switching (ZVS) inverter and the corresponding modulation scheme, which uses variable and fixed switching frequency operation during the sinusoidal period to limit the switching frequency range. It is suitable for generating sinusoidal output waveforms and ensuring lossless switching over the entire fundamental period. ZVS requires a sufficiently long dead time during both switches are turned off. Typically, standard modulation schemes apply a fixed dead time. First experiments operate the ZVS inverter with a fixed dead time. Despite achieving lossless switching, unexpected high device temperatures of the Gallium Nitride half-bridge switches occur. The origin of these high temperatures need to be figured out in order to minimize the losses of the power stage. A study shows that significant reverse conduction losses occur during the half-bridge’s dead time. Thus, this paper introduces an adaptive dead time method, which shows its effectiveness at an experimental setup by reducing the semiconductor’s device case temperature by 10 K. Since the computational effort for this optimal procedure is relatively high, the paper finally presents a simplified, computationally less costly variant that achieves almost the same improvements regarding the device temperatures.
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