{"title":"有耗体附近微波电磁场采样探针阵列设计的实际考虑","authors":"M. Le Blanc, G. Delisle","doi":"10.1109/CCECE.1995.528123","DOIUrl":null,"url":null,"abstract":"Arrays of microwave detectors based on short dipoles and Schottky diodes can be used for sampling the field near a scatterer. The use of such arrays requires a quantitative knowledge of the errors brought about by the couplings between the probes. A study of those errors is presented for several probe lengths and field configurations.","PeriodicalId":158581,"journal":{"name":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Practical considerations in the design of probe arrays for microwave E-field sampling near a lossy body\",\"authors\":\"M. Le Blanc, G. Delisle\",\"doi\":\"10.1109/CCECE.1995.528123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Arrays of microwave detectors based on short dipoles and Schottky diodes can be used for sampling the field near a scatterer. The use of such arrays requires a quantitative knowledge of the errors brought about by the couplings between the probes. A study of those errors is presented for several probe lengths and field configurations.\",\"PeriodicalId\":158581,\"journal\":{\"name\":\"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCECE.1995.528123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1995 Canadian Conference on Electrical and Computer Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCECE.1995.528123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Practical considerations in the design of probe arrays for microwave E-field sampling near a lossy body
Arrays of microwave detectors based on short dipoles and Schottky diodes can be used for sampling the field near a scatterer. The use of such arrays requires a quantitative knowledge of the errors brought about by the couplings between the probes. A study of those errors is presented for several probe lengths and field configurations.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
