{"title":"用于毫米波噪声测量的偏置晶体管测试夹具","authors":"J. Izadian","doi":"10.1109/ARFTG.1987.323851","DOIUrl":null,"url":null,"abstract":"Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Transistor Test-Fixture with Biasing for Millimeter-Wave Noise Measurement\",\"authors\":\"J. Izadian\",\"doi\":\"10.1109/ARFTG.1987.323851\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.\",\"PeriodicalId\":287736,\"journal\":{\"name\":\"29th ARFTG Conference Digest\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1987-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1987.323851\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1987.323851","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transistor Test-Fixture with Biasing for Millimeter-Wave Noise Measurement
Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.
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