{"title":"用干涉测量技术和机器视觉校正量块长度的变化","authors":"Pawat Phuaknoi, J. Buajarern, A. Tonmueanwai","doi":"10.1109/ECTICON.2013.6559505","DOIUrl":null,"url":null,"abstract":"A Michelson interferometer method for determining the variation in length of gauge blocks is presented. This method is based on phase shift interferometer measuring a fringe fraction of the interference fringes on a gauge block measuring surface and its auxiliary plate. The reference standard of measurement is the wavelength of stabilized He-Ne Laser at 633 nm which is traceable to the international standard of the metre. The system was also verified by the 543 nm stabilized He-Ne Laser. The interference fringe patterns are observed by a CCD camera and the images are processed by a Machine Vision system. This make the system run automatically and fulfill. The measurement results were compared with the standard method and they agree with comparable uncertainty.","PeriodicalId":273802,"journal":{"name":"2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology","volume":"19 3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Variation in length of gauge blocks calibration using interferometry technique and machine vision\",\"authors\":\"Pawat Phuaknoi, J. Buajarern, A. Tonmueanwai\",\"doi\":\"10.1109/ECTICON.2013.6559505\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A Michelson interferometer method for determining the variation in length of gauge blocks is presented. This method is based on phase shift interferometer measuring a fringe fraction of the interference fringes on a gauge block measuring surface and its auxiliary plate. The reference standard of measurement is the wavelength of stabilized He-Ne Laser at 633 nm which is traceable to the international standard of the metre. The system was also verified by the 543 nm stabilized He-Ne Laser. The interference fringe patterns are observed by a CCD camera and the images are processed by a Machine Vision system. This make the system run automatically and fulfill. The measurement results were compared with the standard method and they agree with comparable uncertainty.\",\"PeriodicalId\":273802,\"journal\":{\"name\":\"2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology\",\"volume\":\"19 3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-05-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTICON.2013.6559505\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTICON.2013.6559505","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Variation in length of gauge blocks calibration using interferometry technique and machine vision
A Michelson interferometer method for determining the variation in length of gauge blocks is presented. This method is based on phase shift interferometer measuring a fringe fraction of the interference fringes on a gauge block measuring surface and its auxiliary plate. The reference standard of measurement is the wavelength of stabilized He-Ne Laser at 633 nm which is traceable to the international standard of the metre. The system was also verified by the 543 nm stabilized He-Ne Laser. The interference fringe patterns are observed by a CCD camera and the images are processed by a Machine Vision system. This make the system run automatically and fulfill. The measurement results were compared with the standard method and they agree with comparable uncertainty.
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