{"title":"电光采样法研究行波放大器内部微波传播和畸变特性","authors":"M. Rodwell, M. Riaziat, K. Weingarten, D. Bloom","doi":"10.1109/MWSYM.1986.1132184","DOIUrl":null,"url":null,"abstract":"The internal signal propagation and saturation characteristics of two monolithic microwave travelling-wave amplifiers (TWA) are measured by electro-optic sampling. Gate and drainline responses are compared with theory and simulation, leading to revisions in the FET models. Drain voltage frequency dependence and harmonic current propagation together lead to more complex saturation behavior than is discussed in the literature.","PeriodicalId":109161,"journal":{"name":"1986 IEEE MTT-S International Microwave Symposium Digest","volume":"173 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"45","resultStr":"{\"title\":\"Internal Microwave Propagation and Distortion Characteristics of Travelling-Wave Amplifiers Studied by Electro-Optic Sampling\",\"authors\":\"M. Rodwell, M. Riaziat, K. Weingarten, D. Bloom\",\"doi\":\"10.1109/MWSYM.1986.1132184\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The internal signal propagation and saturation characteristics of two monolithic microwave travelling-wave amplifiers (TWA) are measured by electro-optic sampling. Gate and drainline responses are compared with theory and simulation, leading to revisions in the FET models. Drain voltage frequency dependence and harmonic current propagation together lead to more complex saturation behavior than is discussed in the literature.\",\"PeriodicalId\":109161,\"journal\":{\"name\":\"1986 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"173 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"45\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1986 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1986.1132184\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1986.1132184","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Internal Microwave Propagation and Distortion Characteristics of Travelling-Wave Amplifiers Studied by Electro-Optic Sampling
The internal signal propagation and saturation characteristics of two monolithic microwave travelling-wave amplifiers (TWA) are measured by electro-optic sampling. Gate and drainline responses are compared with theory and simulation, leading to revisions in the FET models. Drain voltage frequency dependence and harmonic current propagation together lead to more complex saturation behavior than is discussed in the literature.