用于电子系统状态自适应测试的ATDP套件结构

12th International Conference Microwave and Telecommunication Technology Pub Date : 2002-09-09 DOI:10.1109/CRMICO.2002.1137329

I. Magda, A. Pashchenko, I. Shapoval, V. Novikov

{"title":"用于电子系统状态自适应测试的ATDP套件结构","authors":"I. Magda, A. Pashchenko, I. Shapoval, V. Novikov","doi":"10.1109/CRMICO.2002.1137329","DOIUrl":null,"url":null,"abstract":"The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.","PeriodicalId":378024,"journal":{"name":"12th International Conference Microwave and Telecommunication Technology","volume":"29 24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The ATDP suite structure for adaptive testing of electronic system states\",\"authors\":\"I. Magda, A. Pashchenko, I. Shapoval, V. Novikov\",\"doi\":\"10.1109/CRMICO.2002.1137329\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.\",\"PeriodicalId\":378024,\"journal\":{\"name\":\"12th International Conference Microwave and Telecommunication Technology\",\"volume\":\"29 24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"12th International Conference Microwave and Telecommunication Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CRMICO.2002.1137329\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"12th International Conference Microwave and Telecommunication Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CRMICO.2002.1137329","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

介绍了自适应测试与数据处理软件套件(ATDP套件)的结构和特点。该方法适用于非线性、不稳定电子系统的实验时间序列动态特性恢复。演示了在ATDP套件中实现的基本方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

The ATDP suite structure for adaptive testing of electronic system states

The structure and features of the adaptive testing and data processing software suite (ATDP suite) are presented. It is applied for the dynamic characteristics restoration, from experimental time series, of nonlinear and unstable electronic systems. The basic methods realized in the ATDP suite are demonstrated.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

12th International Conference Microwave and Telecommunication Technology

自引率

0.00%

发文量

期刊最新文献

Low loss phase shifter based on piezocontrolled dielectric composite Controlled power divider on the basis of thin-film ferroelectric elements Retrieval of fast processes distorted by integrated circuits Application of the software for BWA systems for analysis and design Microwave diagnostics of cubic boron nitride