{"title":"白光散斑成像分析","authors":"Moran Davoodi, Y. Buchris, I. Cohen","doi":"10.1109/ICSEE.2018.8646158","DOIUrl":null,"url":null,"abstract":"In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.","PeriodicalId":254455,"journal":{"name":"2018 IEEE International Conference on the Science of Electrical Engineering in Israel (ICSEE)","volume":"17 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Analysis of White Light Speckle Imaging\",\"authors\":\"Moran Davoodi, Y. Buchris, I. Cohen\",\"doi\":\"10.1109/ICSEE.2018.8646158\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.\",\"PeriodicalId\":254455,\"journal\":{\"name\":\"2018 IEEE International Conference on the Science of Electrical Engineering in Israel (ICSEE)\",\"volume\":\"17 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on the Science of Electrical Engineering in Israel (ICSEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSEE.2018.8646158\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on the Science of Electrical Engineering in Israel (ICSEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSEE.2018.8646158","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, we present a new approach for analyzing white light speckle patterns. The paper introduces an analytic model and heuristic explanations for the phenomena using the contrast and intensity statistics of the speckles. Relations between the coherence length, central wavelength and surface roughness are examined. It is shown that the speckle intensity is directly related to the autocorrelation function. We show that the new approach is consistent with previous models using simulation results and experimental data.