暂态容错线性有限状态机的随机数状态编码

H. Ichihara, Y. Maeda, T. Iwagaki, Tomoo Inoue
{"title":"暂态容错线性有限状态机的随机数状态编码","authors":"H. Ichihara, Y. Maeda, T. Iwagaki, Tomoo Inoue","doi":"10.1109/DFT.2019.8875383","DOIUrl":null,"url":null,"abstract":"Stochastic computing (SC) has attractive characteristics, compared with deterministic (or general binary) computing, such as smaller area of the implemented circuits, higher fault tolerance and so on. This study focuses on the transient fault tolerance of SC circuits with linear finite state machines (linear FSMs). To improve the transient fault tolerability of linear-FSM-based SC circuits, we propose a scheme for encoding the states of the FSM with stochastic numbers (SNs). Moreover, we discuss approximating state transition of the FSM so as to reduce the area overhead. The proposed SC circuits are modeled as Markov processes to clarify their behaviors when any transient fault occurs. Experimental results clarify the improvement in the fault tolerability of the SC circuits based on the proposed state encoding with SNs.","PeriodicalId":415648,"journal":{"name":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines\",\"authors\":\"H. Ichihara, Y. Maeda, T. Iwagaki, Tomoo Inoue\",\"doi\":\"10.1109/DFT.2019.8875383\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Stochastic computing (SC) has attractive characteristics, compared with deterministic (or general binary) computing, such as smaller area of the implemented circuits, higher fault tolerance and so on. This study focuses on the transient fault tolerance of SC circuits with linear finite state machines (linear FSMs). To improve the transient fault tolerability of linear-FSM-based SC circuits, we propose a scheme for encoding the states of the FSM with stochastic numbers (SNs). Moreover, we discuss approximating state transition of the FSM so as to reduce the area overhead. The proposed SC circuits are modeled as Markov processes to clarify their behaviors when any transient fault occurs. Experimental results clarify the improvement in the fault tolerability of the SC circuits based on the proposed state encoding with SNs.\",\"PeriodicalId\":415648,\"journal\":{\"name\":\"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFT.2019.8875383\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2019.8875383","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

与确定性(或一般二进制)计算相比,随机计算具有实现电路面积小、容错能力强等优点。研究了基于线性有限状态机的SC电路的暂态容错问题。为了提高基于线性FSM的SC电路的暂态容错性,提出了一种用随机数(sn)编码FSM状态的方案。此外,我们还讨论了FSM状态转移的近似问题,以减少面积开销。所提出的SC电路被建模为马尔可夫过程,以澄清其在任何暂态故障发生时的行为。实验结果表明,基于SNs的状态编码提高了SC电路的容错性。
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State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Stochastic computing (SC) has attractive characteristics, compared with deterministic (or general binary) computing, such as smaller area of the implemented circuits, higher fault tolerance and so on. This study focuses on the transient fault tolerance of SC circuits with linear finite state machines (linear FSMs). To improve the transient fault tolerability of linear-FSM-based SC circuits, we propose a scheme for encoding the states of the FSM with stochastic numbers (SNs). Moreover, we discuss approximating state transition of the FSM so as to reduce the area overhead. The proposed SC circuits are modeled as Markov processes to clarify their behaviors when any transient fault occurs. Experimental results clarify the improvement in the fault tolerability of the SC circuits based on the proposed state encoding with SNs.
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