{"title":"低频场发射产品的电磁场暴露评价","authors":"I. Brooker, J. Robijns","doi":"10.1109/ICSMC2.2003.1428274","DOIUrl":null,"url":null,"abstract":"This paper presents an overview of the assessment process for some examples of low frequency sources of electromagnetic field exposure. It contains a brief overview of the types of system as well as the non-uniformity of the field patterns and consequent exposure. Evaluation techniques from recent European Standards are summarised, reviewing the use of both field level and induced current density for assessment. A comparison is made between the results obtained from assessing according to the different criteria. In conclusion, there are some comments on the need for a global approach to handle the special difficulties in assessing these products","PeriodicalId":272545,"journal":{"name":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","volume":"92 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electromagnetic field exposure assessment for low frequency field emitting products\",\"authors\":\"I. Brooker, J. Robijns\",\"doi\":\"10.1109/ICSMC2.2003.1428274\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an overview of the assessment process for some examples of low frequency sources of electromagnetic field exposure. It contains a brief overview of the types of system as well as the non-uniformity of the field patterns and consequent exposure. Evaluation techniques from recent European Standards are summarised, reviewing the use of both field level and induced current density for assessment. A comparison is made between the results obtained from assessing according to the different criteria. In conclusion, there are some comments on the need for a global approach to handle the special difficulties in assessing these products\",\"PeriodicalId\":272545,\"journal\":{\"name\":\"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.\",\"volume\":\"92 5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSMC2.2003.1428274\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSMC2.2003.1428274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electromagnetic field exposure assessment for low frequency field emitting products
This paper presents an overview of the assessment process for some examples of low frequency sources of electromagnetic field exposure. It contains a brief overview of the types of system as well as the non-uniformity of the field patterns and consequent exposure. Evaluation techniques from recent European Standards are summarised, reviewing the use of both field level and induced current density for assessment. A comparison is made between the results obtained from assessing according to the different criteria. In conclusion, there are some comments on the need for a global approach to handle the special difficulties in assessing these products