测试和维护

{"title":"测试和维护","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"28 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Testing and Maintenance\",\"authors\":\"J. Pecht, M. Pecht\",\"doi\":\"10.1201/9781351074179-8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":346503,\"journal\":{\"name\":\"Long-Term Non-Operating Reliability of Electronic Products\",\"volume\":\"28 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-07-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Long-Term Non-Operating Reliability of Electronic Products\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781351074179-8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Long-Term Non-Operating Reliability of Electronic Products","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781351074179-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}