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Long-Term Non-Operating Reliability of Electronic Products最新文献

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A Framework for Non-Operating Reliability Assessment 非运行可靠性评估框架
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-9
J. Pecht, M. Pecht
{"title":"A Framework for Non-Operating Reliability Assessment","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-9","DOIUrl":"https://doi.org/10.1201/9781351074179-9","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"os-14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128085152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Testing and Maintenance 测试和维护
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-8
J. Pecht, M. Pecht
{"title":"Testing and Maintenance","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-8","DOIUrl":"https://doi.org/10.1201/9781351074179-8","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"28 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126191779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiation Failure Mechanisms 辐射失效机制
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-5
M. Pecht
{"title":"Radiation Failure Mechanisms","authors":"M. Pecht","doi":"10.1201/9781351074179-5","DOIUrl":"https://doi.org/10.1201/9781351074179-5","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123567887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Corrosion Failure Mechanisms 腐蚀失效机理
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-4
J. Pecht, M. Pecht
{"title":"Corrosion Failure Mechanisms","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-4","DOIUrl":"https://doi.org/10.1201/9781351074179-4","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132186927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Non-Operating Reliability Assessment 非运行可靠性评估
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-2
J. Pecht, M. Pecht
{"title":"Non-Operating Reliability Assessment","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-2","DOIUrl":"https://doi.org/10.1201/9781351074179-2","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131366927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mechanical Failure Mechanisms 机械失效机制
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-6
J. Pecht, M. Pecht
{"title":"Mechanical Failure Mechanisms","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-6","DOIUrl":"https://doi.org/10.1201/9781351074179-6","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122750288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Long-Term Non-Operating Reliability of Selected Electronic Products 选定电子产品长期不运行的可靠性
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-7
J. Pecht, M. Pecht
{"title":"Long-Term Non-Operating Reliability of Selected Electronic Products","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-7","DOIUrl":"https://doi.org/10.1201/9781351074179-7","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127724409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical Failure Mechanisms 电气故障机制
Long-Term Non-Operating Reliability of Electronic Products
Pub Date : 2019-07-23 DOI: 10.1201/9781351074179-3
J. Pecht, M. Pecht
{"title":"Electrical Failure Mechanisms","authors":"J. Pecht, M. Pecht","doi":"10.1201/9781351074179-3","DOIUrl":"https://doi.org/10.1201/9781351074179-3","url":null,"abstract":"","PeriodicalId":346503,"journal":{"name":"Long-Term Non-Operating Reliability of Electronic Products","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125313457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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