{"title":"医疗电子产品运行可靠性评估的非参数方法","authors":"J. Garipova, Toncho Papanchev, A. Georgiev","doi":"10.1109/ET50336.2020.9238264","DOIUrl":null,"url":null,"abstract":"This paper is focused on the non-parametric reliability analysis of medical items by means of applying graphical methods to determination and assessment the survival function distribution of measuring items in medicine containing electronic elements. The analysis is based on Kaplan-Meier product limit estimation and fitting the survival function distribution using the linear transformation procedure. As a result, both the probability distribution and the survival probability estimation values regarding operational reliability indices valid for medical items under test are experimentally obtained.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Non-Parametrical Approach for Operational Reliability Assessing Related to Medical Electronic Items\",\"authors\":\"J. Garipova, Toncho Papanchev, A. Georgiev\",\"doi\":\"10.1109/ET50336.2020.9238264\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper is focused on the non-parametric reliability analysis of medical items by means of applying graphical methods to determination and assessment the survival function distribution of measuring items in medicine containing electronic elements. The analysis is based on Kaplan-Meier product limit estimation and fitting the survival function distribution using the linear transformation procedure. As a result, both the probability distribution and the survival probability estimation values regarding operational reliability indices valid for medical items under test are experimentally obtained.\",\"PeriodicalId\":178356,\"journal\":{\"name\":\"2020 XXIX International Scientific Conference Electronics (ET)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 XXIX International Scientific Conference Electronics (ET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ET50336.2020.9238264\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 XXIX International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET50336.2020.9238264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Non-Parametrical Approach for Operational Reliability Assessing Related to Medical Electronic Items
This paper is focused on the non-parametric reliability analysis of medical items by means of applying graphical methods to determination and assessment the survival function distribution of measuring items in medicine containing electronic elements. The analysis is based on Kaplan-Meier product limit estimation and fitting the survival function distribution using the linear transformation procedure. As a result, both the probability distribution and the survival probability estimation values regarding operational reliability indices valid for medical items under test are experimentally obtained.
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