{"title":"一种具有自测能力的混合模A/D转换器","authors":"C. Leme, J. Franca, F. Maloberti, M. Piedade","doi":"10.1109/ESSCIRC.1988.5468460","DOIUrl":null,"url":null,"abstract":"This paper describes a 15-bit resolution self-calibrated A/D conversion system which can also realise the complementary D/A conversion. This makes it possible to implement a closed loop D/A + A/D conversion which can be used for performing a self-testing of the converter.","PeriodicalId":197244,"journal":{"name":"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A Mixed-Mode A/D Converter with Self-Testing Capability\",\"authors\":\"C. Leme, J. Franca, F. Maloberti, M. Piedade\",\"doi\":\"10.1109/ESSCIRC.1988.5468460\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a 15-bit resolution self-calibrated A/D conversion system which can also realise the complementary D/A conversion. This makes it possible to implement a closed loop D/A + A/D conversion which can be used for performing a self-testing of the converter.\",\"PeriodicalId\":197244,\"journal\":{\"name\":\"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1988.5468460\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC '88: Fourteenth European Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1988.5468460","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
摘要
本文介绍了一种15位分辨率的自校准a /D转换系统,该系统还可以实现互补性的D/ a转换。这使得实现闭环D/ a + a /D转换成为可能,该转换可用于执行转换器的自测试。
A Mixed-Mode A/D Converter with Self-Testing Capability
This paper describes a 15-bit resolution self-calibrated A/D conversion system which can also realise the complementary D/A conversion. This makes it possible to implement a closed loop D/A + A/D conversion which can be used for performing a self-testing of the converter.