{"title":"基于遗传算法的RO PUF建模分析的可扩展性和性能评价","authors":"Taichi Umeda, Y. Nozaki, M. Yoshikawa","doi":"10.1109/GCCE46687.2019.9015463","DOIUrl":null,"url":null,"abstract":"Counterfeit electronic devices cause severe problems. As a countermeasure of the problems, physical unclonable function (PUF), which uses production variations of semiconductor, has attracted attention. However, the threat of modeling analysis, which clones authentication ID of PUF, has been reported. Although, the modeling analysis method using genetic algorithm (GA) was proposed, the scalability of this method has not been evaluated. In order to secure the safety of PUF, it is important to evaluate the flexibility of the modeling analysis method. Therefore, this paper evaluates the scalability and performance of GA based the modeling analysis for ring oscillator (RO) PUF.","PeriodicalId":303502,"journal":{"name":"2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Scalability and Performance Evaluation of GA Based Modeling Analysis for RO PUF\",\"authors\":\"Taichi Umeda, Y. Nozaki, M. Yoshikawa\",\"doi\":\"10.1109/GCCE46687.2019.9015463\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Counterfeit electronic devices cause severe problems. As a countermeasure of the problems, physical unclonable function (PUF), which uses production variations of semiconductor, has attracted attention. However, the threat of modeling analysis, which clones authentication ID of PUF, has been reported. Although, the modeling analysis method using genetic algorithm (GA) was proposed, the scalability of this method has not been evaluated. In order to secure the safety of PUF, it is important to evaluate the flexibility of the modeling analysis method. Therefore, this paper evaluates the scalability and performance of GA based the modeling analysis for ring oscillator (RO) PUF.\",\"PeriodicalId\":303502,\"journal\":{\"name\":\"2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GCCE46687.2019.9015463\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE 8th Global Conference on Consumer Electronics (GCCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GCCE46687.2019.9015463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Scalability and Performance Evaluation of GA Based Modeling Analysis for RO PUF
Counterfeit electronic devices cause severe problems. As a countermeasure of the problems, physical unclonable function (PUF), which uses production variations of semiconductor, has attracted attention. However, the threat of modeling analysis, which clones authentication ID of PUF, has been reported. Although, the modeling analysis method using genetic algorithm (GA) was proposed, the scalability of this method has not been evaluated. In order to secure the safety of PUF, it is important to evaluate the flexibility of the modeling analysis method. Therefore, this paper evaluates the scalability and performance of GA based the modeling analysis for ring oscillator (RO) PUF.