{"title":"量子元胞自动机故障检测新技术","authors":"Binu K. Mathew, Shajimon K. John, C. Pradeep","doi":"10.1109/ICETET.2008.186","DOIUrl":null,"url":null,"abstract":"Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.","PeriodicalId":269929,"journal":{"name":"2008 First International Conference on Emerging Trends in Engineering and Technology","volume":"117 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"New Technique for Fault Detection in Quantum Cellular Automata\",\"authors\":\"Binu K. Mathew, Shajimon K. John, C. Pradeep\",\"doi\":\"10.1109/ICETET.2008.186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.\",\"PeriodicalId\":269929,\"journal\":{\"name\":\"2008 First International Conference on Emerging Trends in Engineering and Technology\",\"volume\":\"117 5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 First International Conference on Emerging Trends in Engineering and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICETET.2008.186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 First International Conference on Emerging Trends in Engineering and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICETET.2008.186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
New Technique for Fault Detection in Quantum Cellular Automata
Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.
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