可变容错数字辅助高速IO PHY

Eduard Roytman, M. Nagarajan, Rahul Shah, Xin Ma, R. Bedard, Kambiz Munshi, R. Iknaian, Fengxiang Cai, Jian Xu, Gayathri Sridharan Devi, Pradeep Vempada
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引用次数: 0

摘要

技术的规模化导致电源电压的降低和随机器件可变性的增加,从而给模拟设计带来了新的挑战。在系统架构和电路拓扑级别上对设计方法进行全面检查是必要的,以保持链路的鲁棒性和对低电源电压和随机变异性挑战的容忍度。本文介绍了用于在Poulson (32nm下一代Intel Itanium微处理器)上实现每通道6.4GT/s、14mW/Gbps模拟前端高速IO接口的关键模拟电路架构技术[1]。
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Variation tolerant digitally assisted high-speed IO PHY
Technology scaling leads to reduction of supply voltage and increase in random device variability and thus creates new challenges for analog design. A complete overhaul of the design approach at system architecture and circuit topology levels is necessary to keep the link robust and tolerant to low supply voltage and random variability challenges. This paper presents key analog circuit architecture techniques employed to implement 6.4GT/s per lane, 14mW/Gbps analog front end high-speed IO interfaces on Poulson — a 32nm next generation Intel Itanium microprocessor [1].
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